中華人民共和國國家標準(中國大陸GB標準)英文版 |
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GB標準是中華人民共和國國家標準，也叫GB國標，是中國大陸強制執行的國家標準，所有中國大陸境內銷售的商品及提供服務都必須符合GB國家標準的要求，包括進口商品及服務； 本網站提供GB國家標準的查詢檢索，英文版翻譯，GB標準產品檢測檢驗及合規性分析服務； |
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JJF 30903-2006 （中英文版） Specification for calibration of digital and vector signal generator |
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JJG(SJ)306002-2006 （中英文版） Specification for verification of standard samples of radio frequency electric medium |
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JJG 306001-2006 （中英文版） Specification for verification of standardizer of radio frequency coaxial impedance |
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JJG(SJ)306003-2006 （中英文版） Specification for verification of leakage current testers |
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JJG(SJ)30902-2006 （中英文版） Specification for verification of absolute spectral response rate of photodetectors |
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JJG(SJ)306001-2006 （中英文版） Specification for verification of standardizer of radio frequency coaxial impedance |
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JJF 30701-2006 （中英文版） Specification for calibration of generators of voltage sag, short interruption and voltage change |
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JJF 005-2006 （中英文版） The Y201A type lap uniformity machine calibration specification |
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JJG 306002-2006 （中英文版） Specification for verification of standard samples of radio frequency electric medium |
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SJ 20527.8-2006 （中英文版） Microwave assembly Detail specification for model SCZ-1 T/R |
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GB/T?20171-2006 用于工业测量与控制系统的EPA系统结构与通信规范（中英文版） EPA system architecture and communication specification for use in industrial control and measurement systems |
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JJG 310003-2006 （中英文版） Specification for verification of capacitor parameter testers for semiconductor discrete devices |
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JJG 310005-2006 （中英文版） Specification for verification of high temperature dynamic aging system of integrated circuit |
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JJG 310006-2006 （中英文版） Specification for verification of noise detectors for particle collision of devices |
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JJG(SJ)310002-2006 （中英文版） Specification for verification of DC parameter testers for semiconductor discrete devices |
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JJG 306003-2006 （中英文版） Specification for verification of leakage current testers |
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JJG(SJ)310004-2006 （中英文版） Specification for verification of transistor h parameter testers |
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JJG(SJ)310005-2006 （中英文版） Specification for verification of high temperature dynamic aging system of integrated circuit |
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JJG(SJ)310006-2006 （中英文版） Specification for verification of noise detectors for particle collision of devices |
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JJG(SJ)31001-2006 （中英文版） Specification for verification of testing system for integrated circuit electrostatic discharge susceptibility |
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